DEFECT MODELS AND SELF DIFFUSION IN URANIUM CARBIDE. = MODELES DE DEFAUTS ET AUTO DIFFUSION DANS LE CARBURE D'URANIUMCATLOW CRA.1976; J. MATER. NUCL.; PAYS-BAS; DA. 1976; VOL. 60; NO 2; PP. 151-157; ABS. FR. ALLEM.; BIBL. 17 REF.Article

THE THERMODYNAMICS OF MIXED OXIDE REACTOR FUELS.CATLOW CRA.1977; J. MATER. NUCL.; PAYS-BAS; DA. 1977; VOL. 67; NO 1-2; PP. 236-238; BIBL. 8 REF.Article

CRYSTAL DEFECT PROBLEMSSCHWUTTKE GH.1982; PHOTOVOLTAIC SPECIALISTS CONFERENCE. 16/1982-09-27/SAN DIEGO CA; USA; NEW YORK: IEEE; DA. 1982; PP. 327-332; BIBL. 4 REF.Conference Paper

Microstructure and fission gas bubbles in irradiated mixed carbide fuels at 2 to 11 a/o burnupRAY, I. L. F; BLANK, H.Journal of nuclear materials. 1984, Vol 124, pp 159-174, issn 0022-3115Article

DEFECT STRUCTURES OF UO_2+X AND U₄O_{9 +OU- Y} = STRUCTURES DE DEFAUTS DE UO_2+X ET U₄O_{9 +OU- Y}MATSUI T; NAITO K.1975; J. NUCL. SCI. TECHNOL.; JAP.; DA. 1975; VOL. 12; NO 4; PP. 250-253; BIBL. 19 REF.Article

Proceedings of the 26^th International Conference on Defects in Semiconductors 26th ICDSEVANS-FREEMAN, Jan; VERNON-PARRY, Karen; ALLEN, Martin et al.Physica. B, Condensed matter. 2012, Vol 407, Num 15, issn 0921-4526, 242 p.Conference Proceedings

Transverse instability of line defects of period-2 spiral wavesPARK, Jin-Sung; WOO, Sung-Jae; LEE, Kyoung J et al.Physical review letters. 2004, Vol 93, Num 9, pp 098302.1-098302.4, issn 0031-9007Article

Evaluation of the relative volume of a vacancyGLADKIKH, N. T; KRYSHTAL', A. P.Physics of metals and metallography. 1998, Vol 85, Num 1, pp 36-37, issn 0031-918XArticle

Gamma-ray diffraction in the study of siliconKURBAKOV, A. I; SOBOLEV, N. A.Materials science & engineering. B, Solid-state materials for advanced technology. 1994, Vol 22, Num 2-3, pp 149-158, issn 0921-5107Article

Dislocation polarization and screening effectsKHANNANOV, SH. KH.Physics of metals and metallography. 1992, Vol 74, Num 4, pp 334-338, issn 0031-918XArticle

POTENTIEL D'OXYGENE ET STRUCTURE DE DEFAUT DE L'OXYDE MIXTE (UPU)O_2-X. = OXYGEN POTENTIEL AND DEFECT STRUCTURE OF MIXED OXIDE (UPU)O_2-XSCHMITZ F.1975; J. MATER. NUCL.; PAYS-BAS; DA. 1975; VOL. 58; NO 3; PP. 357-360; BIBL. 12 REF.Article

Recognition of defect structure of Si(A4) by on-line support vector machineDZIEDZIC, Tomasz; BEDKOWSKI, Janusz; JANKOWSKI, Stanisław et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6937, pp 69371W.1-69371W.5, issn 0277-786X, isbn 978-0-8194-7124-6 0-8194-7124-0, 2Conference Paper

Detection of dislocations in strongly absorbing crystals by projection x-ray topography in back reflectionSHUL'PINA, I. L; ARGUNOVA, T. S.Journal of physics. D, Applied physics (Print). 1995, Vol 28, Num 4A, pp A47-A49, issn 0022-3727Conference Paper

Soliton superlattices on the (0001) surface of C₇₀ single crystalsJIANG, L; IYODA, T; TRYK, D. A et al.Surface science. 1998, Vol 408, Num 1-3, pp 112-122, issn 0039-6028Article

The hierarchical defect structure and the kinetics of the β→α transformation in the Pd―H systemREVKEVICH, G. P; KNYAZEVA, M. A; OLEMSKOI, A. I et al.Physics of metals and metallography. 1992, Vol 74, Num 3, pp 226-230, issn 0031-918XArticle

Defect monitoring using scanning photoluminescence spectroscopy in multicrystalline silicon wafersOSTAPENKO, S; TARASOV, I; KALEJS, J. P et al.Semiconductor science and technology. 2000, Vol 15, Num 8, pp 840-848, issn 0268-1242Article

Deviations from Volterra dislocationsSCHOECK, G.Philosophical magazine letters. 1998, Vol 77, Num 3, pp 141-146, issn 0950-0839Article

Characterization of silicon wafer back sides with low thermal oxide layers by copper depositionSCHMOLKE, R; PUPPE, G; PIONTEK, H et al.Journal of the Electrochemical Society. 2000, Vol 147, Num 8, pp 3081-3086, issn 0013-4651Article

Internal stresses in dislocation wall structuresSEDLACEK, R.Scripta metallurgica et materialia. 1995, Vol 33, Num 2, pp 283-288, issn 0956-716XArticle

Plasticity : looking toward physics ?BRECHET, Y.Journal de physique. III (Print). 1994, Vol 4, Num 6, pp 1011-1016, issn 1155-4320Article

Observation of complicated surface defects by photoacoustic microscopy and nondestructive evaluationENDOH, H; HIWATASHI, Y; HOSHIMIYA, T et al.Japanese journal of applied physics. 1997, Vol 36, Num 5B, pp 3312-3317, issn 0021-4922, 1Conference Paper

Microwave anisotropies from cosmic defectsCOULSON, D; FERREIRA, P; GRAHAM, P et al.Nature (London). 1994, Vol 368, Num 6466, pp 27-31, issn 0028-0836Article

The impact of platelet oxygen precipitates in silicon on the junction leakage current and the interstitial oxygen lossCZERWINSKI, A.Journal of physics. Condensed matter (Print). 2002, Vol 14, Num 48, pp 13135-13140, issn 0953-8984, 6 p.Conference Paper

On the possible identification of defects using the autocorrelation function approach in double Doppler broadening of annihilation radiation spectroscopyBELING, C. D; LIMING, W; SHAN, Y. Y et al.Journal of physics. Condensed matter (Print). 1998, Vol 10, Num 46, pp 10475-10492, issn 0953-8984Conference Paper

Structural characterization of thin films formed or changed on materials by micro Raman spectroscopyWITKE, K; BRZEZINKA, K.-W; REICH, P et al.Fresenius' journal of analytical chemistry. 1998, Vol 361, Num 6-7, pp 619-620, issn 0937-0633Conference Paper